The HNT-PKIT test probe kits is designed to provide the probes required by UL / IEC / EN 61032, the IP Code standard. It includes the following products:
· Test Sphere Probe with handle (HNT-PA)
· Jointed Finger Probe (with banana jack in handle) (HNT-PB)
· 2.5 mm Test Rod (HNT-PC)
· 1.0 mm Test Wire (HNT-PD)
· aluminum suitcase
IEC/EN 61032 60529 test probe kits for ip1x ip2x ip3x ip4x accessibility probes
The HNT-PKIT test probe kits is designed to provide the probes required by UL / IEC / EN 61032, the IP Code standard. It includes the following products:
· Test Sphere Probe with handle (HNT-PA)
· Jointed Finger Probe (with banana jack in handle) (HNT-PB)
· 2.5 mm Test Rod (HNT-PC)
· 1.0 mm Test Wire (HNT-PD)
· aluminum suitcase
Meets Requirements for Testing Standard(s) including but not limited to:IEC61032
IP1X Probe A Technical Parameters:
1, Ball Diameter: 50mm
2, Baffle Plate Diameter: 45mm
3, Baffle Plate Thickness:4mm
4, Handle Diameter: 10mm
5, Handle Length :100mm
IP2X Test Finger Probe Technical Parameters:
1, Knurled Finger Diameter:12mm
2, Knurled Finger Length :80mm
3, Baffle Plate Diameter :50mm
4, Baffle Plate Length : 100mm
IP3X Test Probe C technical parameters
1, Test Probe Length :100mm
2, Test Probe Diameter:2.5mm
3, Dam- sphere Diameter:35mm
4, Handle Diameter:10mm
5, Handle Length 100mm
IP4X Test Probe D Technical parameters
1, Test Probe Length :100mm
2, Test Probe Diameter:1.0mm
3,Dam- sphere Diameter:35mm
4,Handle Diameter:10mm
5,Handle Length 100mm
